Citation: | JI Ang. Development of X-ray Fluorescence Spectrometry in the 30 Years[J]. Rock and Mineral Analysis, 2012, 31(3): 383-398. |
Kikkert J N. X-ray spectrometry in the eighties [J]. Spectrochim Acta Part B, 1983, 38(11-12): 1497-1508.
Kikkert J N. X-ray spectrometry in the eighties [J]. Spectrochim Acta Part B, 1983, 38(11-12): 1497-1508.
|
van Grieken R, Markowicz A, Veny P. Current trends in the literature on X-ray emission spectrometry [J].X-Ray Spectrometry, 1991,20(6): 271-276.
van Grieken R, Markowicz A, Veny P. Current trends in the literature on X-ray emission spectrometry [J].X-Ray Spectrometry, 1991,20(6): 271-276.
|
Injuk J, van Grieken R. Literature trends in X-ray emission spectrometry in the period 1990—2000—A review[J]. X-Ray Spectrometry,2003,32(1): 35-39.
Injuk J, van Grieken R. Literature trends in X-ray emission spectrometry in the period 1990—2000—A review[J]. X-Ray Spectrometry,2003,32(1): 35-39.
|
Ellis A T,Potts P J,Holmes M,Oliver G L,Streli C, Wobrauschek P. Atomic spectrometry update-X-ray fluorescence spectrometry[J]. Journal of Analytical Atomic Spectrometry,1996,11: 409R-442R.
Ellis A T,Potts P J,Holmes M,Oliver G L,Streli C, Wobrauschek P. Atomic spectrometry update-X-ray fluorescence spectrometry[J]. Journal of Analytical Atomic Spectrometry,1996,11: 409R-442R.
|
West M,Ellis A T,Potts P J,Steli C,Vanhoof C,Wegrzynek D, Worbrausckek P. Atomic spectrometry update-X-ray fluorescence spectrometry [J]. Journal of Analytical Atomic Spectrometry,2011,26: 1919-1963.
West M,Ellis A T,Potts P J,Steli C,Vanhoof C,Wegrzynek D, Worbrausckek P. Atomic spectrometry update-X-ray fluorescence spectrometry [J]. Journal of Analytical Atomic Spectrometry,2011,26: 1919-1963.
|
Zhang L X. Theoretical derivation of fluorescent X-ray intensities in X-ray fluorescence spectrochemical analysis[J]. X-Ray Spectrometry,1984,13(2): 52-54.
Zhang L X. Theoretical derivation of fluorescent X-ray intensities in X-ray fluorescence spectrochemical analysis[J]. X-Ray Spectrometry,1984,13(2): 52-54.
|
郭常霖,吉昂,陶光仪.原级X射线谱强度分布的定量测定[J].物理学报,1981,30(10): 1351-1360.
|
Pella P A,Feng L, Small J A. Analytical algorithm for calculation of spectral distributions of X-ray tubes for quantitative X-ray fluorescence analysis[J].X-Ray Spectrometry,1985,14: 125-135.
Pella P A,Feng L, Small J A. Analytical algorithm for calculation of spectral distributions of X-ray tubes for quantitative X-ray fluorescence analysis[J].X-Ray Spectrometry,1985,14: 125-135.
|
Tao G Y,Pella P A,Rousseau R M. NBSGSC—A Fortran Program for Quantitative X-ray Fluorescence Analysis . Gaithersburg: National Bureau of Standards,1985.
Tao G Y,Pella P A,Rousseau R M. NBSGSC—A Fortran Program for Quantitative X-ray Fluorescence Analysis . Gaithersburg: National Bureau of Standards,1985.
|
马光祖,袁汉章.X射线荧光光谱分析的进展[J].分析试验室,1987,6(5-6): 131
-136.
|
马光祖,袁汉章.X射线荧光光谱分析[J].分析试验室,1989,8(4): 62-74.
|
吉昂.X射线荧光光谱分析[J].分析试验室,1991,10(4): 133-142.
|
吉昂.X射线荧光光谱分析[J].分析试验室,1993,12(3): 70-79
,109.
|
陶光仪.X射线荧光光谱分析[J].分析试验室,1995,14(3): 92-100.
|
陶光仪.X射线荧光光谱分析[J].分析试验室,1997,16(3): 94-100.
|
罗立强,马光祖.X射线荧光与粒子激发X射线光谱分析[J].分析试验室,1999,18(4): 100-107.
|
吉昂,卓尚军.X射线荧光光谱分析[J].分析试验室,2001,20(4): 103-108.
|
卓尚军,吉昂.X射线荧光光谱分析[J].分析试验室,2003,22(3): 102-108.
|
卓尚军,吉昂.X射线荧光光谱分析[J].分析试验室,2006,25(5): 113-122.
|
卓尚军.X射线荧光光谱分析[J].分析试验室,2007,26(12): 112-122.
|
卓尚军.X射线荧光光谱分析[J].分析试验室,2009,28(7): 112-122.
|
谢荣厚,高新华,邬时海.X射线荧光光谱分析的进展[J].冶金分析,1997,17(2): 34-38.
|
Tsuji K, Injuk J, van Grieken R.X-Ray Spectrmetry: Recent Technological Advances[M]. John Wiley & Sons, 2004.
Tsuji K, Injuk J, van Grieken R.X-Ray Spectrmetry: Recent Technological Advances[M]. John Wiley & Sons, 2004.
|
罗立强.X射线荧光光谱分析的现状与趋势[J].光谱学与光谱分析,2006,26(1): 189-191.
|
吉昂,李国会,张华.高能偏振能量色散X射线荧光光谱仪应用现状和进展[J].岩矿测试,2008,27(6): 451-462.
|
许涛,罗立强.原位微区X射线荧光光谱分析装置与技术研究进展[J].岩矿测试,2011,30(3): 375-383.
|
陈雪亮,巩岩,陈波.掠出X射线荧光分析技术与掠入射X射线荧光分析技术[J].光学精密工程,2004,12(2): 174-176.
|
张家骅,徐君权,朱节清.放射性同位素X射线荧光分析[M].北京: 原子能出版社,1981.
|
任炽刚,承唤生,汤国魂,陈建新,姚惠英.质子X荧光分析和质子显微镜[M].北京: 原子能出版社,1981.
|
谢忠信,赵宗玲,张玉斌,陈远盘,丰梁垣.X射线光谱分析[M].北京: 科学出版社,1982.
|
章晔.X射线荧光探矿技术[M].北京: 地质出版社,1984.
|
王毅民.实用X射线谱线图表[M].北京: 原子能出版社,1989.
|
刘彬,黄衍初,贺晓华.环境样品X射线荧光光谱分析[M].乌鲁木齐: 新疆大学出版社,1996.
|
曹利国.能量色散X射线荧光方法[M].成都: 成都科技大学出版社,1998.
|
吉昂,陶光仪,卓尚军,罗立强.X射线荧光光谱分析[M].北京: 科学出版社,2003. 142-153; 247-262
; 166-170; 238-246; 115-134.
|
梁钰.X射线荧光光谱分析基础[M].北京: 科学出版社,2007.
|
罗立强,詹秀春,李国会.X射线荧光光谱仪[M].北京: 化学工业出版社,2008.
|
卓尚军,陶光仪,韩小元.X射线荧光光谱的基本参数法[M].上海: 上海科学技术出版社,2010.
|
吉昂,卓尚军,李国会.能量色散X射线荧光光谱[M].北京: 科学岀版社,2011. 177-191; 192-214
; 305-325; 404-431.
|
赵宗玲.X射线荧光分析译文集[M].北京: 地质出版社,1981.
|
赖因霍尔德·克洛肯凯帕.全反射X射线荧光分折(1997)[M].王晓红,王毅民,王永奉,译.北京: 原子能出版社,2002.
|
吉昂,倪德顺.波长色散X射线荧光光谱仪的最新发展[J].光谱实验室,1987,4(1): 1-7.
|
倪德顺,吉昂.波长色散X射线荧光光谱仪的最新进展之二——高压发生器、测角仪、X光管的进展[J].光谱实验室,1987,4(2): 51-54.
|
马光祖,吉昂.X射线荧光光谱仪的发展——1.顺序式波长X射线荧光光谱仪[J].分析测试仪器通讯,1994,4(4): 20-22.
|
谢荣厚,高新华,盛伟志,丁志强.现代X射线荧光光谱仪的进展[J].冶金分析,1999,19(1): 32-36.
|
董慧茹, 董吉源.X射线荧光光谱仪的进展[J].分析仪器,1998(2): 6-14.
|
Brouwer P.Theory of XRF //PANalytical Netherlands, 2003: 32.
Brouwer P.Theory of XRF //PANalytical Netherlands, 2003: 32.
|
Strüder L, Lutz G, Lechner P, Soltau H, Holl P.Semi-conductor Detector for (Imaging) X-ray Spectroscopy [M]//Tsuji K, Injuk J, van Grieken R.X-Ray Spectrmetry: Recent Technological Advances. John Wiley & Sons,2004: 133-193.
Strüder L, Lutz G, Lechner P, Soltau H, Holl P.Semi-conductor Detector for (Imaging) X-ray Spectroscopy [M]//Tsuji K, Injuk J, van Grieken R.X-Ray Spectrmetry: Recent Technological Advances. John Wiley & Sons,2004: 133-193.
|
Swoboda W, Beekhoff B, Kanngiesser B, Seheer J. Use of Al2O3 as a Barkla scatterer for the production of polarized excitation radiation in EDXRF[J].X-Ray Spectrometry,1993,22: 317-322.
Swoboda W, Beekhoff B, Kanngiesser B, Seheer J. Use of Al2O3 as a Barkla scatterer for the production of polarized excitation radiation in EDXRF[J].X-Ray Spectrometry,1993,22: 317-322.
|
颜一鸣,丁训良.使用X光聚束系统的X射线荧光分析[J].核技术,1994,17(6): 340-342.
|
丁训良,梁炜,颜一鸣.使用X光透镜的XRF谱仪的研究进展[J].核技术,1996,19(3): 164-169.
|
丁训良,赫业军,颜一鸣.X光透镜在μ-XRF分析中的应用[J].原子核物理评论,1997,14(8): 155-157.
|
初学莲,林晓燕,程 琳,潘秋丽,杨 君,丁训良.微束X射线荧光分析谱仪及其对松针中元素的分布分析[J].北京师范大学学报, 2007,43(5): 530-532.
|
Kunimura S, Kawai J. Portable total X-ray fluorescence spectrometer for ultra trace elemental determination[J].Advances in X-Ray Chemical Analysis, 2010,41: 29-43.
Kunimura S, Kawai J. Portable total X-ray fluorescence spectrometer for ultra trace elemental determination[J].Advances in X-Ray Chemical Analysis, 2010,41: 29-43.
|
黄宇营.上海光源进展及其有关XRS方法介绍 //第九届全国X射线光谱学术报告会论文集.北京: 中国地质学会岩矿测试技术专业委员会,2011: 18.
|
Cesareo R,Brunetti A,Castllano A,Rosales M A. Portable Equipment for X-ray Fluorescence Analysis[M]//Tsuji K, Injuk J, van Grieken R.X-Ray Spectrometry: Recent Technological Advances.John Wiley & Sons,2004: 30-40.
Cesareo R,Brunetti A,Castllano A,Rosales M A. Portable Equipment for X-ray Fluorescence Analysis[M]//Tsuji K, Injuk J, van Grieken R.X-Ray Spectrometry: Recent Technological Advances.John Wiley & Sons,2004: 30-40.
|
葛良全.现场X射线荧光分析技术的进展 //第九届全国X射线光谱学术报告会论文集.北京: 中国地质学会岩矿测试技术专业委员会,2011: 9-17.
|
Harada M, Sakurai K.K-line X-ray fluorescence analy-sis of high-Z elements[J].Spectrochim Acta B,1999,54: 29-39.
Harada M, Sakurai K.K-line X-ray fluorescence analy-sis of high-Z elements[J].Spectrochim Acta B,1999,54: 29-39.
|
Nakai I.High-energy X-Ray Fluorescenc[M]//Tsuji K, Injuk J, van Grieken R.X-Ray Spectrometry: Recent Technological Advances.John Wiley & Sons,2004: 355-372.
Nakai I.High-energy X-Ray Fluorescenc[M]//Tsuji K, Injuk J, van Grieken R.X-Ray Spectrometry: Recent Technological Advances.John Wiley & Sons,2004: 355-372.
|
Epsilon 5 EDXRF Spectrometer System User's Guide[M].PANalytical,2003.
Epsilon 5 EDXRF Spectrometer System User's Guide[M].PANalytical,2003.
|
詹秀春,罗立强.偏振激发-能量色散X射线荧光光谱法快速分析地质样品中34种元素[J].光谱学与光谱分析,2003,34(4): 804-807.
|
刘亚雯.全反射X射线荧光分析法[J].光谱学与光谱分析,1987,7(4): 9-13.
|
范钦敏,刘亚雯,李道伦,魏成连,胡金生.纳克级全反射X射线荧光分析[J].光谱学与光谱分析, 1990,10(6): 64-67.
|
Wolfgang M, Birgit K. A model for the confocal volme of 3D micro X-ray fluorescence Spectrometer[J].Spectrochimica Acta Part B,2005,60: 1334.
Wolfgang M, Birgit K. A model for the confocal volme of 3D micro X-ray fluorescence Spectrometer[J].Spectrochimica Acta Part B,2005,60: 1334.
|
Lin X, Wang Z, Sun T, Pan Q, Ding X. Character-ization and applications of a new tabletop confocal micro X-ray fluorescence setup[J].Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms,2008,266(11): 2838-2642.
Lin X, Wang Z, Sun T, Pan Q, Ding X. Character-ization and applications of a new tabletop confocal micro X-ray fluorescence setup[J].Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms,2008,266(11): 2838-2642.
|
Wei X, Lei Y, Sun T. Elemental depth profile of faux bamboo paint forbidden city studied by synchrotron radiation confocal μ-XRF[J].X-Ray Spectrometry,2008,37: 595-598.
Wei X, Lei Y, Sun T. Elemental depth profile of faux bamboo paint forbidden city studied by synchrotron radiation confocal μ-XRF[J].X-Ray Spectrometry,2008,37: 595-598.
|
Tsuji K,Nakano K. Development of confocal 3D micro-XRF spectrometer with dual Cr-Mo excitation[J].X-Ray Spectrometry,2007,36(3): 145-149.
Tsuji K,Nakano K. Development of confocal 3D micro-XRF spectrometer with dual Cr-Mo excitation[J].X-Ray Spectrometry,2007,36(3): 145-149.
|
杨健,葛良全,张邦,王汉彬.微束微区X荧光探针仪的机械系统设计[J].机械设计与研究,2009,25(2): 90-92.
|
Sherman J. The theoretical derivation of fluorescent X-ray intensities from mixture [J].Spectrochim Acta,1955,7: 283-306.
Sherman J. The theoretical derivation of fluorescent X-ray intensities from mixture [J].Spectrochim Acta,1955,7: 283-306.
|
de Jongh W K. X-ray fluorescence analysis applying theoretical matrix corrections. Stainless steel[J].X-Ray Spectrometry,1973,2: 151-158.
de Jongh W K. X-ray fluorescence analysis applying theoretical matrix corrections. Stainless steel[J].X-Ray Spectrometry,1973,2: 151-158.
|
Criss J W, Birks L S. Callibration methods for fluore-scence X-ray spectrometry[J].Analytical Chemistry,1968,40: 1080-1086.
Criss J W, Birks L S. Callibration methods for fluore-scence X-ray spectrometry[J].Analytical Chemistry,1968,40: 1080-1086.
|
Criss J W. 'NRLXRF’, COSMIC Program and Docu-mentation DOD-65,Computer Software Management and Information Center . Athens: University of Georgia,1977.
Criss J W. 'NRLXRF’, COSMIC Program and Docu-mentation DOD-65,Computer Software Management and Information Center . Athens: University of Georgia,1977.
|
Huang T C. Quantitative X-ray fluorescence analysis of thin films using LAMA-2 [J].X-Ray Spectrometry,1981,10: 28-30.
Huang T C. Quantitative X-ray fluorescence analysis of thin films using LAMA-2 [J].X-Ray Spectrometry,1981,10: 28-30.
|
Huang T C. Quantitative X-ray fluorescence analysis of single-layer and multi-layer thin films[J].Thin Solid Films, 1988,157(2): 283-290.
Huang T C. Quantitative X-ray fluorescence analysis of single-layer and multi-layer thin films[J].Thin Solid Films, 1988,157(2): 283-290.
|
Huang T C. Thin-film characterization by X-ray fluoresc-ence[J].X-Ray Spectrometry,1991, 20: 29-33.
Huang T C. Thin-film characterization by X-ray fluoresc-ence[J].X-Ray Spectrometry,1991, 20: 29-33.
|
Criss J W. Fundamental parameters calculations on a laboratory micro-computer [J].Advances in X-Ray Analysis,1980,23: 93-95.
Criss J W. Fundamental parameters calculations on a laboratory micro-computer [J].Advances in X-Ray Analysis,1980,23: 93-95.
|
Nielson K K,Sanders R W. The SAP3 Program for Quantitative Multi-element Analysis by Energy Dispersive X-Ray Fluorescence . Pacific North-West Laboratory, 1982.
Nielson K K,Sanders R W. The SAP3 Program for Quantitative Multi-element Analysis by Energy Dispersive X-Ray Fluorescence . Pacific North-West Laboratory, 1982.
|
Feng L Y, Cross B J, Richard W. New developments in FP-based software for both bulk and thin-film XRF analysis[J].Advances in X-Ray Analysis,1992,35: 703-709.
Feng L Y, Cross B J, Richard W. New developments in FP-based software for both bulk and thin-film XRF analysis[J].Advances in X-Ray Analysis,1992,35: 703-709.
|
Feng L Y. A simple approach to multilayer thin film analysis based on theoretical calculations using fundamental parameters method[J].Advances in X-Ray Analysis,1993,36: 279-286.
Feng L Y. A simple approach to multilayer thin film analysis based on theoretical calculations using fundamental parameters method[J].Advances in X-Ray Analysis,1993,36: 279-286.
|
Software CiREG, Version 4.1, CiLT and CiROU, Version 6.0, Les logiciels [Z]. Canada: R. Rousseau Inc.
Software CiREG, Version 4.1, CiLT and CiROU, Version 6.0, Les logiciels [Z]. Canada: R. Rousseau Inc.
|
陶光仪.X射线荧光光谱分析中计算机软件的新进展[J].冶金分析,1994,14(2): 31-34.
|
Rousseau R M. Debate on some algorithms relating concentration to intensity in XRF spectrometry[J]. The Rigaku Journal, 2002,19(1): 25-34.
Rousseau R M. Debate on some algorithms relating concentration to intensity in XRF spectrometry[J]. The Rigaku Journal, 2002,19(1): 25-34.
|
Rousseau R M. Concept of the influence coefficient [J]. The Rigaku Journal,2001,18(1): 8-21.
Rousseau R M. Concept of the influence coefficient [J]. The Rigaku Journal,2001,18(1): 8-21.
|
Rousseau R M, Boivin J A.The fundamental algorithm: A natural extension of Sherman equation. Part 1: Theory [J]. X-Ray Spectrometry,1998,15(1): 13-27.
Rousseau R M, Boivin J A.The fundamental algorithm: A natural extension of Sherman equation. Part 1: Theory [J]. X-Ray Spectrometry,1998,15(1): 13-27.
|
Rousseau R M. Some consideration on how to solve the Sherman equation in practice[J].Spectrochemca Acta Part B,2004,59: 1491-1502.
Rousseau R M. Some consideration on how to solve the Sherman equation in practice[J].Spectrochemca Acta Part B,2004,59: 1491-1502.
|
Rousseau R M.Correction for effects in X-ray fluore-scence analysis—A tutorial[J].Spectrochemca Acta Part B,2006,61: 759-777.
Rousseau R M.Correction for effects in X-ray fluore-scence analysis—A tutorial[J].Spectrochemca Acta Part B,2006,61: 759-777.
|
Broll N, Tertian R. Quantitative X-ray fluorescence ana-lysis use of fundamental influence coefficients[J].X-Ray Spectrometry,1983,12: 30-37.
Broll N, Tertian R. Quantitative X-ray fluorescence ana-lysis use of fundamental influence coefficients[J].X-Ray Spectrometry,1983,12: 30-37.
|
Lachance G R, Claisse F.Quantitative X-Ray Fluore-scence Analysis: Theory and Application[M]. London: John Wiley & Sons,1995.
Lachance G R, Claisse F.Quantitative X-Ray Fluore-scence Analysis: Theory and Application[M]. London: John Wiley & Sons,1995.
|
Willis J P, Lachance G L. Comparison between some common influence coefficient algorithms [J].X-Ray Spectrometry,2004,33: 181-188.
Willis J P, Lachance G L. Comparison between some common influence coefficient algorithms [J].X-Ray Spectrometry,2004,33: 181-188.
|
Willis J P, Lachance G L. Resolving apparent differ-ences in mathematical expressions relating intensity to concentration in X-ray fluorescence spectrometry[J].The Regaku Journal,2000,17(1): 23-33.
Willis J P, Lachance G L. Resolving apparent differ-ences in mathematical expressions relating intensity to concentration in X-ray fluorescence spectrometry[J].The Regaku Journal,2000,17(1): 23-33.
|
Willis J P, Lachance G L. A new approach to correcting theoretical emitted intensities for absorption and enhancement effects[J].X-Ray Spectrometry,2004,33: 204-211.
Willis J P, Lachance G L. A new approach to correcting theoretical emitted intensities for absorption and enhancement effects[J].X-Ray Spectrometry,2004,33: 204-211.
|
Tao G Y, Zhuo S J, Ji A, Norrish K, Senff U E. An attempt at improving the accuracy of calculated relative intensities from theory in X-ray fluorescence spectrometry[J].X-Ray Spectrometry, 1998,27: 357-366.
Tao G Y, Zhuo S J, Ji A, Norrish K, Senff U E. An attempt at improving the accuracy of calculated relative intensities from theory in X-ray fluorescence spectrometry[J].X-Ray Spectrometry, 1998,27: 357-366.
|
陶光仪,卓尚军,吉昂.X射线荧光光谱中影响理论计算相对强度的主要因素[J].化学学报,1998,56(9): 873-879.
|
陶光仪,卓尚军,吉昂.提高X射线荧光理论计算相对强度准确度的研究[J].分析化学,1998,26(11): 1350-1354.
|
卓尚军,陶光仪,殷之文,吉昂.X射线荧光光谱理论强度计算中激发因子的选择[J].化学学报,2001,59(1): 129-132.
|
Zhuo S J, Tao G Y, Ji A. Application of selected fundamental parameters in X-ray fluorescence analysis[J].X-Ray Spectrometry,2003,32: 8-12.
Zhuo S J, Tao G Y, Ji A. Application of selected fundamental parameters in X-ray fluorescence analysis[J].X-Ray Spectrometry,2003,32: 8-12.
|
Ochi H, Watanabe S.X-ray fluorescence analysis using theoretical intensity of scattered X-rays[J].Advances in X-Ray Analysis, 2006,37: 45-63.
Ochi H, Watanabe S.X-ray fluorescence analysis using theoretical intensity of scattered X-rays[J].Advances in X-Ray Analysis, 2006,37: 45-63.
|
Ogawa R, Ochi H, Nishino S, Ichimaru N, Yamato R, Watanabe S. X-ray fluorescence analysis for irregularly shaped resin samples using theoretical intensity of scattered X-rays [J]. Advances in X-Ray Analysis,2009,40: 233-242.
Ogawa R, Ochi H, Nishino S, Ichimaru N, Yamato R, Watanabe S. X-ray fluorescence analysis for irregularly shaped resin samples using theoretical intensity of scattered X-rays [J]. Advances in X-Ray Analysis,2009,40: 233-242.
|
Janssens K, Espen P V. Implementation of an expert system for the qualitative interpretation of X-ray fluorescence spectra[J].Analytica Chimica Acta,1986, 184: 117-132.
Janssens K, Espen P V. Implementation of an expert system for the qualitative interpretation of X-ray fluorescence spectra[J].Analytica Chimica Acta,1986, 184: 117-132.
|
Chu J Z, Hu S X, Tao G Y. Numerical processing of wavelength-dispersive X-ray fluorescence spectra[J].Chemometrics and Intelligent Laboratory Systems, 1996, 32: 73-82.
Chu J Z, Hu S X, Tao G Y. Numerical processing of wavelength-dispersive X-ray fluorescence spectra[J].Chemometrics and Intelligent Laboratory Systems, 1996, 32: 73-82.
|
Chu J Z, Hu S X, Tao G Y. An expert system for qualitative interpretation of wavelength-dispersive X-ray fluorescence spectra[J].Chemometrics and Intelligent Laboratory Systems, 1996, 32 : 83-93.
Chu J Z, Hu S X, Tao G Y. An expert system for qualitative interpretation of wavelength-dispersive X-ray fluorescence spectra[J].Chemometrics and Intelligent Laboratory Systems, 1996, 32 : 83-93.
|
UniQuant Manual[Z]. Netherlands: Omega Data Systems,1999.
UniQuant Manual[Z]. Netherlands: Omega Data Systems,1999.
|
Han X Y, Zhu J Q, Wang P L, Tao G Y, Ji A. Calculation of the contributions of scattering effects to the X-ray fluorescence intensities for light matrix samples[J].Analytica Chemica Acta,2005,538(1-2): 297-302.
Han X Y, Zhu J Q, Wang P L, Tao G Y, Ji A. Calculation of the contributions of scattering effects to the X-ray fluorescence intensities for light matrix samples[J].Analytica Chemica Acta,2005,538(1-2): 297-302.
|
Pavlinskii G V, Vladimirova L I. Determination of low atomic number elements by X-ray fluorescence fundamental parameter method [J].Journal of Analytical Chemistry, 2009, 64(3): 253-258.
Pavlinskii G V, Vladimirova L I. Determination of low atomic number elements by X-ray fluorescence fundamental parameter method [J].Journal of Analytical Chemistry, 2009, 64(3): 253-258.
|
Pavlinskii G V, Gorbunov M S, Portnoi A Y. Bremss-trahlung of the free electrons arising in an irradiated specimen [J].Russian Physics Journal, 2009,52(7): 679-687.
Pavlinskii G V, Gorbunov M S, Portnoi A Y. Bremss-trahlung of the free electrons arising in an irradiated specimen [J].Russian Physics Journal, 2009,52(7): 679-687.
|
Sogut O, Kukonder A Buyukkasap E Kukonder E. Measurement of K-shell fluorescence yields for Br and I compounds using radioisotope XRF[J].Journal of Quantitative Spectroscopy & Radiative Transfer,2003, 76: 17-21.
Sogut O, Kukonder A Buyukkasap E Kukonder E. Measurement of K-shell fluorescence yields for Br and I compounds using radioisotope XRF[J].Journal of Quantitative Spectroscopy & Radiative Transfer,2003, 76: 17-21.
|
Erdogan Büyükkasap. Analytical note Alloying effect on K shell fluorescence yield in CrxNi1-x and CrxAl1-x alloys[J].Spectrochimica Actc Part B,1998,53: 499-503.
Erdogan Büyükkasap. Analytical note Alloying effect on K shell fluorescence yield in CrxNi1-x and CrxAl1-x alloys[J].Spectrochimica Actc Part B,1998,53: 499-503.
|
mer S üt. Investigation of the K shell fluorescence yields of Cr, Mn, Fe, Co, Ni, Cu, Zn, Mo, Ag, Cd, Ba, La, Ce, and their compounds[J].Chinese Journal of Physics,2010,48(2): 212-221.
mer S üt. Investigation of the K shell fluorescence yields of Cr, Mn, Fe, Co, Ni, Cu, Zn, Mo, Ag, Cd, Ba, La, Ce, and their compounds[J].Chinese Journal of Physics,2010,48(2): 212-221.
|
Kulshreshtha S K, Wagh D N, Bajpei H N. Chemical effects on X-ray fluorescence yield of Ag+ compounds[J].X-Ray Spectrometry,2005,34: 200-202.
Kulshreshtha S K, Wagh D N, Bajpei H N. Chemical effects on X-ray fluorescence yield of Ag+ compounds[J].X-Ray Spectrometry,2005,34: 200-202.
|
Raghavaiah C V, Venkateswara Rao N, Krishna Sree Murty G, Chandrasekhar Rao M V S, Bhuloka Reddy S, Sastry D L.Kα/Kβ rations and chemical effects in partially filled 3D-shell elements[J].X-Ray Spectrometry,1992,21: 239-243.
Raghavaiah C V, Venkateswara Rao N, Krishna Sree Murty G, Chandrasekhar Rao M V S, Bhuloka Reddy S, Sastry D L.Kα/Kβ rations and chemical effects in partially filled 3D-shell elements[J].X-Ray Spectrometry,1992,21: 239-243.
|
Shioi R, Yamamoto T, Kawai J. Chemical effects on Lα/Lβ ratios of X-ray fluorescence spectra[J]. Advances in X-Ray Analysis, 2009,40: 127-135.
Shioi R, Yamamoto T, Kawai J. Chemical effects on Lα/Lβ ratios of X-ray fluorescence spectra[J]. Advances in X-Ray Analysis, 2009,40: 127-135.
|
Han I, Demir L. Effect of annealing treatment on Kβ-to-Kα X-ray intensity ratios of 3D transition-metal alloys[J]. Physical Review A,2010,81: 062514-1~062514-5.
Han I, Demir L. Effect of annealing treatment on Kβ-to-Kα X-ray intensity ratios of 3D transition-metal alloys[J]. Physical Review A,2010,81: 062514-1~062514-5.
|
Porikli S, Han I, Kurucu Y. Determination of chemical effect on the Kβ1/Kα, Kβ2/Kα, Kβ2 /Kα1 and Kβ/Kα X-ray intensity ratios of 4D transition metals[J].Spectroscopy Letters,2011, 44: 38-46.
Porikli S, Han I, Kurucu Y. Determination of chemical effect on the Kβ1/Kα, Kβ2/Kα, Kβ2 /Kα1 and Kβ/Kα X-ray intensity ratios of 4D transition metals[J].Spectroscopy Letters,2011, 44: 38-46.
|
Sidhu B S, Dhaliwal A S, Mann K S, Kahlon K S. Measurement of K-shell absorption edge jump factors and jump ratios of some medium Z elements using EDXRF technique[J].Radiation Physics and Chemistry, 2011,80: 28-32.
Sidhu B S, Dhaliwal A S, Mann K S, Kahlon K S. Measurement of K-shell absorption edge jump factors and jump ratios of some medium Z elements using EDXRF technique[J].Radiation Physics and Chemistry, 2011,80: 28-32.
|
陈永君,许力,华佑南.标准化测量方法在XRF分析中作用和意义[J].岩矿测试,1988,7(4): 327-331.
|
陈永君.标准化测量方法在XRF分杉中作用和意义的研究——在不同制样条件下的应用[J].岩矿测试,1991,10(3): 232-234.
|
马天芳,李小莉,陈永君,邓震平,李国会.X射荧光光谱分析方法的共享[J].岩矿测试,2011,30(4): 486-490.
|
Philips Analytical X-Ray.NIFECO Program for SuperQ Software [Z].1995.
Philips Analytical X-Ray.NIFECO Program for SuperQ Software [Z].1995.
|
佘卫龙,吉昂.统计试验最优化方法在光谱谱分解中的应用[J].分析化学,1984,12(11): 970-975.
|
Wang Y D, Zhao X, Kowalski B R. X-ray fluore-scence calibration with partial least-squares[J]. Applied Spectroscopy, 1990,44: 998-1002.
Wang Y D, Zhao X, Kowalski B R. X-ray fluore-scence calibration with partial least-squares[J]. Applied Spectroscopy, 1990,44: 998-1002.
|
满瑞林,赵新娜,吉昂.偏最小二乘(PLS)在同位素X射线荧光多组分同时分析中的应用[J].光谱学与光谱分析,1991,11(4): 50-54.
|
罗立强,马光祖,吉昂.X射线荧光光谱分析中偏最小二乘回归技术与基本参数法的研究[J].分析化学,1992,20(9): 1074-1077.
|
张学华, 吉昂, 卓尚军, 陶光仪.SZ-1型同位素X射线荧光分析仪分析多金属结核中锰铁钴镍铜[J].岩矿测试, 1999,18(2): 124-127.
|
Urbanski P, Kowalska E.Application of partial least-squares calibration methods in low-resolution EDXRFS[J].X-Ray Spectrometry, 1995,24: 70-75.
Urbanski P, Kowalska E.Application of partial least-squares calibration methods in low-resolution EDXRFS[J].X-Ray Spectrometry, 1995,24: 70-75.
|
Lemberge K, Van Espen P J, Vrebos B. Analysis of cement using low-resolution energy-dispersive X-ray fluorescence and partial least-squares regression[J].X-Ray Spectrometry,2000,29: 297-304.
Lemberge K, Van Espen P J, Vrebos B. Analysis of cement using low-resolution energy-dispersive X-ray fluorescence and partial least-squares regression[J].X-Ray Spectrometry,2000,29: 297-304.
|
罗立强,郭常霖,马光祖,吉昂.X射线光谱与神经网络中单组分型神经结构研究[J].光谱学与光谱分析,1999,19(3): 426-429.
|
黄启厅,周炼清,史舟,李震宇,顾群.FPXRF——偏最小二乘法定量分析土壤中的铅含量[J].光谱学与光谱分析,2009,29(5): 1434-1438.
|
Klimasara A J. A mathermatical comparical of Lachance- Traill correction produce with standard multiple linear regression analysis in XRF applications[J]. Advances in X-Ray Analysis,1993,36: 1-10.
Klimasara A J. A mathermatical comparical of Lachance- Traill correction produce with standard multiple linear regression analysis in XRF applications[J]. Advances in X-Ray Analysis,1993,36: 1-10.
|
Luo L Q, Guo C L, Ma G Z, Ji A. Choice of optimum model parameters in artificial neural networks and application to X-ray fluorescence analysis[J]. X-Ray Spectrometry, 1997,26: 15-22.
Luo L Q, Guo C L, Ma G Z, Ji A. Choice of optimum model parameters in artificial neural networks and application to X-ray fluorescence analysis[J]. X-Ray Spectrometry, 1997,26: 15-22.
|
Luo L Q, Ji A, Ma G Z, Guo C L. Focusing on one component each time—Comparison of single and multiple-component prediction algorithms in artificial neural networks for X-ray fluorescence analysis [J]. X-Ray Spectrometry,1998, 27: 17-22.
Luo L Q, Ji A, Ma G Z, Guo C L. Focusing on one component each time—Comparison of single and multiple-component prediction algorithms in artificial neural networks for X-ray fluorescence analysis [J]. X-Ray Spectrometry,1998, 27: 17-22.
|
Luo L Q. Predictability comparison of four neural network structures for correcting matrix effects in X-ray fluorescence spectrometry[J].Journal of Trace and Microprobe Techniques,2000,18: 349-360.
Luo L Q. Predictability comparison of four neural network structures for correcting matrix effects in X-ray fluorescence spectrometry[J].Journal of Trace and Microprobe Techniques,2000,18: 349-360.
|
Luo L Q. An algorithm combining neural networks with fundamental parameters[J].X-Ray Spectrometry, 2002, 31: 332-338.
Luo L Q. An algorithm combining neural networks with fundamental parameters[J].X-Ray Spectrometry, 2002, 31: 332-338.
|
Luo L Q. Chemometrics and its applications to X-ray spectrometry[J].X-Ray Spectrometry,2006, 35: 215-225.
Luo L Q. Chemometrics and its applications to X-ray spectrometry[J].X-Ray Spectrometry,2006, 35: 215-225.
|
Luo L Q, Ji A, Guo C L, Ma G Z. Predictability of partial least-squares regression in the determination of copper alloys by X-ray fluorescence analysis [J]. Journal of Trace and Microprobe Techniques, 1998,16(4): 513-522.
Luo L Q, Ji A, Guo C L, Ma G Z. Predictability of partial least-squares regression in the determination of copper alloys by X-ray fluorescence analysis [J]. Journal of Trace and Microprobe Techniques, 1998,16(4): 513-522.
|
罗立强,郭常霖,吉昂,马光祖.化学计量学与X射线荧光光谱分析[J].岩矿测试,1997,16(2): 128-137.
|
罗立强,甘露,吴晓军,吉昂,梁国立.神经网基本参数算法校正非线性基体效应[J].分析试验室,2001,20(1): 1-4.
|
罗立强,马光祖,吉昂,郭常霖,詹秀春,梁国立.神经群结构、算法与X射线荧光光谱分析研究[J].分析科学学报,1998,14(3): 177-182.
|
郭盘林,王基庆,乐安全,朱节清.人工神经网络和最小二乘回归在XRF定量分析中应用比较[J].核技术,1999,22(12): 725-729.
|
Guo P L, Wang J Q, Li X J, Zhu J Q. Combination of pattern recognition with Micro-PIXE for the source indentification individual aerosol particles[J].Applied Specscopy,2000,54(6): 807-811.
Guo P L, Wang J Q, Li X J, Zhu J Q. Combination of pattern recognition with Micro-PIXE for the source indentification individual aerosol particles[J].Applied Specscopy,2000,54(6): 807-811.
|
Guo P L, Wang J Q, Li X J, Zhu J Q.Study of metal bioaccumulation by nuclear micoprobe analysis of Alage fossils and living algae cells[J]. Nuclear Instruments and Methods in Physics Research Section B,2000,161-163: 801-807.
Guo P L, Wang J Q, Li X J, Zhu J Q.Study of metal bioaccumulation by nuclear micoprobe analysis of Alage fossils and living algae cells[J]. Nuclear Instruments and Methods in Physics Research Section B,2000,161-163: 801-807.
|
Wang J Q, Guo P L, Li X J, Zhu J Q. Identification of air pollution source by single aerosol particles fingerprints-Micro-PIXE spectra[J]. Nuclear Instruments and Methods in Physics Research Section B,2000,161-163: 830-835.
Wang J Q, Guo P L, Li X J, Zhu J Q. Identification of air pollution source by single aerosol particles fingerprints-Micro-PIXE spectra[J]. Nuclear Instruments and Methods in Physics Research Section B,2000,161-163: 830-835.
|
李哲,庹先国,穆克亮,王洪辉,钟红梅.矿样中钛铁EDXRF分析的基体效应和神经网络校正研究[J].核技术,2009,32(1): 35-40.
|
Vincze L, Janssens K, Vekemans B, Adams F. Monte Carlo Simulation for X-ray Fluorescence Spectroscopy[M]//Tsuji K,Injuk J,Van Grieken. X-Ray Spectromery: Recent Technological Advances,2004: 435-461.
Vincze L, Janssens K, Vekemans B, Adams F. Monte Carlo Simulation for X-ray Fluorescence Spectroscopy[M]//Tsuji K,Injuk J,Van Grieken. X-Ray Spectromery: Recent Technological Advances,2004: 435-461.
|
李德华,程业勋.X射线荧光分析中蒙特卡罗方法的应用[J].核技术,1990,13(3): 139-147.
|
de Boer D K G. Calculation of X-ray fluorescence intensities from bulk and multi-layer samples[J].X-Ray Spectrometry, 1990, 19(3): 145-154.
de Boer D K G. Calculation of X-ray fluorescence intensities from bulk and multi-layer samples[J].X-Ray Spectrometry, 1990, 19(3): 145-154.
|