Analysis of Basalt Glass by Electron Probe Micro Analyzer

This method analyzes the components of SiO₂, CaO, Al₂O₃, Fe₂O₃, MgO, K₂O, TiO₂, Na₂O and P₂O₅ of basalt glass by JEOL JXA-8100 electron probe micro-analyzers. In order to accurately determine the contents of silicate quickly, the various analysis conditions were optimized for different analysis purposes, such as prismatic crystal, probing spot, accelerating voltage, revised means, beam current and so on. The optimum conditions were utilized to determine the components of silicate by comparing experimental data. The results show that small prismatic crystals of high sensitivity should be selected for low contents element measurements and the characteristic wavelength of the determined elements should be chosen in the mid wave band of the testing range. Accuracy can be improved by increasing accelerating voltage and beam current for low content samples. A larger probing spot should be selected for the elements which mobile easily. The PRZ method was applied to correct data of the multi-elements samples, which carry a large range of atomic numbers.