Abstract:
BACKGROUNDAssociated elements in copper deposits are of high economic value. However, they are difficult to locate and utilize because of their fine (micrometer to nanometer) size.
OBJECTIVESTo develop a method for determining the occurrence of associated elements in copper deposits.
METHODSBackscatter image, secondary electron image, X-ray spectrum point, line and mapping analysis technology were used to determine the mineral phases, morphological characteristics, occurrence, qualitative/quantitative and distribution laws of the associated elements of the copper deposit. The acceleration voltage of the scanning electron microscope was 20kV, the emission current was 10μA, and the energy spectrum dwelling time was 100s.
RESULTSThe key technologies in the sample pretreatment and analysis were discussed in detail to form a set of effective analyses of copper deposits. The energy spectrum-scanning electron microscope (EDX-SEM) microanalysis method of associated elements was established. Gold, silver, cobalt, bismuth, and selenium were all distributed in other minerals in the form of independent minerals or isomorphic substitution.
CONCLUSIONSThrough the study of the occurrence of the associated elements, a micro basis for the identification of mineral industrial value, mine resource evaluation, and the recovery and utilization of associated elements has been established, and provides technical support for mining, beneficiation and smelting formulation.
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