Rapid Analysis of Feldspar by X-ray Diffractometry Rietveld Refinement Method

Jing RAN; Gu DU; feng-yu WANG

doi:10.15898/j.cnki.11-2131/td.201610110154

Rock and Mineral Analysis > 2017 > 36(5): 489-494. > DOI: 10.15898/j.cnki.11-2131/td.201610110154

Jing RAN, Gu DU, feng-yu WANG. Rapid Analysis of Feldspar by X-ray Diffractometry Rietveld Refinement Method[J]. Rock and Mineral Analysis, 2017, 36(5): 489-494. DOI: 10.15898/j.cnki.11-2131/td.201610110154

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Rapid Analysis of Feldspar by X-ray Diffractometry Rietveld Refinement Method

Chengdu Geological Survey Center, China Geological Survey, Chengdu 610081, China

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Received Date: November 20, 2016
Revised Date: July 25, 2017
Accepted Date: August 13, 2017
Published Date: August 31, 2017

Abstract

Highlights
· The more accurate results can be obtained by Rietveld refinement method due to the separation of overlap peak and the correction of preferred orientation.

· The determination of potassium feldspar (the first grade standard materials) fulfills analytical quality requirements of DZ/T 0130—2006 with the absolute error < 1%.

· The Rietveld refinement method can be used for measuring geological samples with the added advantages of simplicity, rapidity and and high efficiency.

ABSTRACT

The content of minerals in feldspar can be calculated by chemical analytical results, but the analytical process is long and the calculation process is complex. Moreover, slice position could affect the result of feldspar content determined by optical microscopy. Feldspar samples were quantitatively analyzed using the Rietveld method in HighScore software. This method can effectively reduce the effect of diffraction peak overlap and correct the diffraction intensity error caused by the preferred orientation. The accuracy of the method is superior to the reference method (RIR method). The quantitative analysis results of the samples are close to the results of the adiabatic method, and the relative deviation is less than 1.69%. Compared to the mineral content by conversion from chemical composition, the absolute error is less than 5%, which meets the allowable error provided by DZ/T 0130-2006. As proved by first grade standard materials of potassium feldspar, the absolute error is less than 1%. The results of quantitative analysis of the feldspar show that the X-ray diffraction full-spectrum fitting method is simple and the analytical quality meets the quality requirements of the relevant standard for the diffraction analysis. It is feasible to analyze rock mineral content in geological samples using this method.
- X-ray Diffractometry,
- Rietveld refinement method,
- quantitative analysis,
- feldspar,
- phase composition

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References (16)

References

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Rapid Analysis of Feldspar by X-ray Diffractometry Rietveld Refinement Method

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