Study on the Morphology of Zircon-bearing Epoxy Resin Surface and Its Effect for LA-ICP-MS Analysis

HU Zhi-zhong; WANG Kun-yang; YAN Xiong; YANG Bo; DU Gu

doi:10.15898/j.cnki.11-2131/td.201909210135

Rock and Mineral Analysis > 2020 > 39(6): 804-815. > DOI: 10.15898/j.cnki.11-2131/td.201909210135

HU Zhi-zhong, WANG Kun-yang, YAN Xiong, YANG Bo, DU Gu. Study on the Morphology of Zircon-bearing Epoxy Resin Surface and Its Effect for LA-ICP-MS Analysis[J]. Rock and Mineral Analysis, 2020, 39(6): 804-815. DOI: 10.15898/j.cnki.11-2131/td.201909210135

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Study on the Morphology of Zircon-bearing Epoxy Resin Surface and Its Effect for LA-ICP-MS Analysis

Chengdu Center of Geological Survey, China Geological Survey, Chengdu 610081, China

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Received Date: September 20, 2019
Revised Date: February 06, 2020
Accepted Date: May 12, 2020
Published Date: October 31, 2020

Abstract

HIGHLIGHTS
(1) The surface morphology of zircon-bearing epoxy resins was characterized by AFM.

(2) The surface morphologies of zircon were investigated under different LA-ICP-MS conditions and modes.

(3) The effect of Ar-ion milling on zircon-bearing epoxy resins was discussed.

ABSTRACT

BACKGROUNDLaser ablation-inductively coupled plasma-mass spectrometry (LA-ICP-MS) is currently one of the commonly used methods for zircon research. This method generally uses epoxy resin targets as carriers. Studying the effect of the surface morphology and flatness of epoxy resin targets helps to evaluate its production process and the accuracy of LA-ICP-MS zircon analysis.
OBJECTIVESTo study the influence of the surface morphology of epoxy resin for zircon analysis by LA-ICP-MS.
METHODSAtomic force microscope (AFM) was used to analyze the surface morphology of zircon epoxy resin target, and the zircon surface morphology was studied by analyzing and comparing the zircon surface morphology under different ablation modes and different ablation conditions of 193nm laser. The influence of flatness on LA-ICP-MS zircon analysis was discussed. Argon ion polishing technology was used to perform secondary polishing on the zircon epoxy resin target, and the influence of this technology on the zircon epoxy resin target was investigated.
RESULTSThe surface of the zircon epoxy resins was generally smooth but slightly uneven. There were scratches from a few to tens nm on the surface of the zircon. The differences in height and gaps existed between zircons and epoxy resin. The slightly uneven surface had less impact on the analysis accuracy than other laser parameters such as energy density, frequency and movement rate. The depth and morphology of different matrices by linear scanning were dissimilar. The scanning depths on the NIST610, CGSG series, zircon 91500 decreased under the same laser condition. The scratches of zircon surface were not obvious after Ar-ion milling, but the zircons may have been damaged.
CONCLUSIONSThe surface morphology of zircon epoxy resins has less impact on the analysis accuracy for LA-ICP-MS. The influence and application of Ar-ion milling for LA-ICP-MS needs further study.
- zircon in epoxy resin,
- atomic force microscope,
- the Ar-ion milling technology,
- the morphology of surface

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