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辉光放电质谱应用和定量分析

徐常昆, 周涛, 赵永刚

徐常昆, 周涛, 赵永刚. 辉光放电质谱应用和定量分析[J]. 岩矿测试, 2012, 31(1): 47-56.
引用本文: 徐常昆, 周涛, 赵永刚. 辉光放电质谱应用和定量分析[J]. 岩矿测试, 2012, 31(1): 47-56.
XU Chang-kun, ZHOU Tao, ZHAO Yong-gang. Application and Quantitative Analysis of Glow Discharge Mass Spectrometry[J]. Rock and Mineral Analysis, 2012, 31(1): 47-56.
Citation: XU Chang-kun, ZHOU Tao, ZHAO Yong-gang. Application and Quantitative Analysis of Glow Discharge Mass Spectrometry[J]. Rock and Mineral Analysis, 2012, 31(1): 47-56.

辉光放电质谱应用和定量分析

基金项目: 

中国计量科学研究院基础科研项目(AKY1031)

Application and Quantitative Analysis of Glow Discharge Mass Spectrometry

  • 摘要: 辉光放电质谱(GDMS)是利用辉光放电源作为离子源的一种无机质谱方法。GDMS采用固体进样,样品准备过程简单、分析速度快、基体效应小、线性范围宽,是痕量分析的一种重要分析手段,在国外已经成为高纯金属和半导体分析的行业标准方法。GDMS可以进行深度分析,选择合适的放电条件,可以在样品表面获得平底坑,深度分辨率可以满足对微米量级的层状样品进行测量。目前商业化的GDMS都是直流放电源,这些仪器需要用第二阴极法或混合法才能对非导电材料进行测量,从而限制了GDMS在非导体材料分析方面的应用。GDMS放电源和单接收方式并不能满足同位素丰度精确测量的要求,在精确度要求不高的情况下,GDMS在固体样品同位素丰度的快速测量方面还是有一定的应用价值。文章总结了近几年国内外GDMS在各领域的应用进展和定量分析技术发展方向。GDMS已经成为一种高纯导电材料分析的重要方法;在深度分析、非导电材料分析、固体同位素丰度快速测量中有一定的应用前景。在定量测量方面,由于受到基体、测量条件等影响因素较多,缺乏合适的基体匹配的标准物质用于校正,GDMS主要停留在定性和半定量分析阶段。目前,国外已有关于GDMS定量分析的报道,采用掺杂的方法合成校正样品,利用一系列校正样品获得的标准曲线实现定量分析,这种方法过程较为复杂,但可以获得较好的定量分析结果,是一种不错的校正方法。
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