Abstract: A method for analysis of halogen in electronic components by oxygen bombion chromatography technology was developed. Electronic components were burnt in oxygen bomb and the reaction products were absorbed by Na2CO3 solution. The chromatographic conditions were studied and optimized as follow: using IonPac AS22 anion exchange column as separation column, isocratic carbonate/bicarbonate as eluent and suppressed conductivity detector for chromatographic detection. The method provides the features of simple operation, good sensitivity and selectivity, good reproducibility, economic and environmental friendly. The method has been proved to be suitable for determination of halogen content in electronic components.