Abstract:
X-ray fluorescence spectrometric method with powdered pellet sample preparation for the determination of P, Ti, V, Ni, Cu, Zn, Ga, Rb, Sr, Nb, Cs, Ba, La, Hf, Zr, Pb, Al2O3, CaO, Fe2O3, K2O, MgO, Na2O, SiO2 in dust samples was developed. Compton scattering line was selected as internal standard and the empirical coefficient method was used for the matrix effect correction. The method has been applied to the determination of these elements in National Standard Reference Materials and the results are in agreement with certified values.