参加第49届丹佛X射线年会有感

Views on the 49th Denver Annual X-Ray Conference

摘要: 报道了第49届丹佛X射线年会的概况。会议期间,痒于微束装置及其分析技术、全反射技术与应用、探测器研制、薄层分析、样品制备、半导体材料分析等，受到广泛关注。

Abstract: The 49th Denver Annual X ray Conference is overviewed in this paper. The attention of the conference is paid to the trends and developments in micro beam techniques, total reflection X ray fluorescence analysis, new X ray detector developments, film a