X射线荧光光谱熔融片法测定超导材料原子数配比

Determination of Atomic Ratio in Bi_K_Ba Superconductor by XRF with Fusion Disk Technique for Sample Preparation

摘要: 报道了用Ｘ射线荧光光谱测定铋钾钡系超导材料原子配比的方法。测量样片用熔融法制备，测定各组分的质量分数后计算原子配比并推出材料的分子式。

Abstract: A method for the determination of atomic ratio in Bi_K_Ba superconductor by XRF with fusion disk technique for sample preparation was developed. Atomic ratio was calculated after the mass fraction for each component was determined. The molecular formula o